The growth and characterization of layered, binary thin-film oxides: MgO–NiO and CaO–NiO
نویسندگان
چکیده
Layered, binary thin-film oxides of NiO, MgO and CaO have been prepared and characterized using low energy electron diffraction, Auger electron spectroscopy, energy loss spectroscopy, ion scattering spectroscopy, and temperature programmed desorption using probe molecules. Epitaxial growth was observed for the NiO–MgO and CaO–NiO systems; however, superior wetting was found for NiO–MgO relative to CaO–NiO. The thermal stabilities of the supported monolayer oxide vary significantly for the four systems studied, i.e. NiO/MgO, NiO/CaO, MgO/NiO and CaO/NiO, with NiO/CaO having the lowest thermal stability and CaO/NiO, the highest. © 1996 American Vacuum Society.
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